国家/地区 Korea（5） Usa（5） China（4）
关键词
出版物 REVIEW OF SCIENTIFIC INSTRUMENTS（19）
出版时间 2022（3） 2011（2） 2012（2） 2013（2） 2014（2） 2020（2）
机构 CHONNAM NATL.（3）
作者 LEE DW（3） BO Z（2） CHOI YS（2） PARK JY（2）

Probing plasma-treated graphene using hyperspectral Raman

REVIEW OF SCIENTIFIC INSTRUMENTS

ROBERT BIGRAS G, VINCHON P, ALLARD C, GLAD X, MARTEL R, STAFFORD L

Angular scattering of protons through ultrathin graphene foils: Application for time-of-flight instrumentation

REVIEW OF SCIENTIFIC INSTRUMENTS

VIRA AD, FERNANDES PA, FUNSTEN HO, MORLEY SK, YAMAGUCHI H, LIU FZ, MOODY NA

Height determination of single-layer graphene on mica at controlled humidity using atomic force microscopy

REVIEW OF SCIENTIFIC INSTRUMENTS

LEE H, PARK JY

Graphene used as a lateral force microscopy calibration material in the low-load non-linear regime

REVIEW OF SCIENTIFIC INSTRUMENTS

BOLAND MJ, HEMPEL JL, ANSARY A, NASSERI M, STRACHAN DR

Selective nano-patterning of graphene using a heated atomic force microscope tip

REVIEW OF SCIENTIFIC INSTRUMENTS

CHOI YS, WU X, LEE DW

Angular scattering of 1-50 keV ions through graphene and thin carbon foils: Potential applications for space plasma instrumentation

REVIEW OF SCIENTIFIC INSTRUMENTS

EBERT RW, ALLEGRINI F, FUSELIER SA, NICOLAOU G, BEDWORTH P, SINTON S, TRATTNER KJ

Note: An ion source for alkali metal implantation beneath graphene and hexagonal boron nitride monolayers on transition metals

REVIEW OF SCIENTIFIC INSTRUMENTS

DE LIMA LH, CUN HY, HEMMI A, KALIN T, GREBER T

Graphene/polydimethylsiloxane nanocomposite strain sensor

REVIEW OF SCIENTIFIC INSTRUMENTS

WANG B, LEE BK, KWAK MJ, LEE DW

Dark field photoelectron emission microscopy of micron scale few layer graphene

REVIEW OF SCIENTIFIC INSTRUMENTS

BARRETT N, CONRAD E, WINKLER K, KROMKER B

Facile characterization of ripple domains on exfoliated graphene

REVIEW OF SCIENTIFIC INSTRUMENTS

CHOI JS, KIM JS, BYUN IS, LEE DH, HWANG IR, PARK BH, CHOI T, PARK JY, SALMERON M