国家/地区 Poland（6）
关键词 GRAPHENE（7）
出版物 DIAMOND RELATED MAT.（2） MICROELECTRONIC ENG.（2）
出版时间 2015（2） 2016（2）
机构 WROCLAW UNIV.（3） WROCLAW UNIV.（3）
作者 GAJEWSKI K（7）

Microscale surface potential gradient disturbances observed in bilayer graphene

APPLIED SURFACE SCIENCE

GAJEWSKI K, RAMADAN S, KUNICKI P, SHAFOROST O, KLEIN N, GOTSZALK T

High-resolution, spatially-resolved surface potential investigations of high-strength metallurgical graphene using scanning tunnelling potentiometry

MICROELECTRONIC ENGINEERING

GAJEWSKI K, KUNICKI P, SIERAKOWSKI A, SZYMANSKI W, KACZOROWSKI W, NIEDZIELSKI P, RAMADAN S, SHAFOROST O, KLEIN N, HAO L, GOTSZALK T

Quasi in-situ observation of the elastic properties changes of the graphene-low-density polyethylene composites

DIAMOND RELATED MATERIALS

GAJEWSKI K, SZYMANSKI W, KACZOROWSKI W, NIEDZIELSKI P, GOTSZALK T

Kelvin Probe Force Microscopy investigations of High Strength Metallurgical Graphene transferred on low-density polyethylene

MICROELECTRONIC ENGINEERING

GAJEWSKI K, SZYMANSKI W, NIEDZIELSKI P, GOTSZALK T

Raman Spectroscopy and Kelvin Probe Force Microscopy characteristics of the CVD suspended graphene

DIAMOND RELATED MATERIALS

GAJEWSKI K, GONISZEWSKI S, SZUMSKA A, MOCZALA M, KUNICKI P, GALLOP J, KLEIN N, HAO L, GOTSZALK T

Self-supporting graphene films and their applications

IET CIRCUITS DEVICES SYSTEMS

GONISZEWSKI S, GALLOP J, ADABI M, GAJEWSKI K, SHAFOROST O, KLEIN N, SIERAKOWSKI A, CHEN J, CHEN YF, GOTSZALK T, HAO L

Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate

MICRON

GAJEWSKI K, KOPIEC D, MOCZALA M, PIOTROWICZ A, ZIELONY M, WIELGOSZEWSKI G, GORSZALK T, STRUPINSKI W