国家/地区 Brazil（3）
关键词 DEFECT（4）
出版物
出版时间
机构 UNIV FED MIN.（2）
作者 JORIO A（4）

Quantifying defects in N-layer graphene via a phenomenological model of Raman spectroscopy

NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION BBEAM INTERACTIONS WITH MATERIALS ATOMS

GIRO R, ARCHANJO BS, FERREIRA EHM, CAPAZ RB, JORIO A, ACHETE CA

Quantifying Defects in Graphene via Raman Spectroscopy at Different Excitation Energies

NANO LETTERS

CANCADO LG, JORIO A, FERREIRA EHM, STAVALE F, ACHETE CA, CAPAZ RB, MOUTINHO MVO, LOMBARDO A, KULMALA TS, FERRARI AC

Defect characterization in graphene and carbon nanotubes using Raman spectroscopy

PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY AMATHEMATICAL PHYSICAL ENGINEERING SCIENCES

DRESSELHAUS MS, JORIO A, SOUZA AG, SAITO R

Disentangling contributions of point and line defects in the Raman spectra of graphene-related materials

2D MATERIALS

CANCADO LG, DA SILVA MG, FERREIRA EHM, HOF F, KAMPIOTI K, HUANG K, PENICAUD A, ACHETE CA, CAPAZ RB, JORIO A