JOURNAL OF PHYSICS DAPPLIED PHYSICS

LIU CI, SCALETTA DS, PATEL DK, KRUSKOPF M, LEVY A, HILL HM, RIGOSI AF

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG

PHYSICA BCONDENSED MATTER

RIGOSI AF, MARZANO M, LEVY A, HILL HM, PATEL DK, KRUSKOPF M, JIN H, ELMQUIST RE, NEWELL DB

AIP ADVANCES

LIU CI, PATEL DK, MARZANO M, KRUSKOPF M, HILL HM, RIGOSI AF

AIP ADVANCES

PATEL D, MARZANO M, LIU CI, HILL HM, KRUSKOPF M, JIN H, HU JN, NEWELL DB, LIANG CT, ELMQUIST R, RIGOSI AF

ACS APPLIED ELECTRONIC MATERIALS

WU BY, YANG YF, RIGOSI AF, HU JN, LEE HY, CHENG GJ, PANCHAL V, KRUSKOPF M, JIN H, WATANABE K, TANIGUCHI T, NEWELL DB, ELMQUIST RE, LIANG CT

CARBON

RIGOSI AE, PATEL D, MARZANO M, KRUSKOPF M, HILL HM, JIN H, HU JN, WALKER ARH, ORTOLANO M, CALLEGARO L, LIANG CT, NEWELL DB

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

RIGOSI AF, PANNA AR, PAYAGALA SU, KRUSKOPF M, KRAFT ME, JONES GR, WU BY, LEE HY, YANG YF, HU JN, JARRETT DG, NEWELL DB, ELMQUIST RE

CARBON

RIGOSI AF, KRUSKOPF M, HILL HM, JIN H, WU BY, JOHNSON PE, ZHANG SY, BERILLA M, WALKER ARH, HACKER CA, NEWELL DB, ELMQUIST RE

SCIENTIFIC REPORTS

HU JN, RIGOSI AF, KRUSKOPF M, YANG YF, WU BY, TIAN JF, PANNA AR, LEE HY, PAYAGALA SU, JONES GR, KRAFT ME, JARRETT DG, WATANABE K, TANIGUCHI T, ELMQUIST RE, NEWELL DB