国家/地区 | Usa(3) |
关键词 |
BILAYER GRAPHENE BL.(2)
BREAKDOWN(2)
RELIABILITY(2)
|
出版物 | |
出版时间 | |
机构 | SUNY ALBANY(2) |
作者 | LEE EK(3) |
ADVANCED MATERIALS
LEE EK, BARUAH RK, LEEM JW, PARK W, KIM BH, URBAS A, KU Z, KIM YL, ALAM MA, LEE CH
IEEE TRANSACTIONS ON NANOTECHNOLOGY
YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B
IEEE ELECTRON DEVICE LETTERS
YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B