MICROELECTRONICS RELIABILITY

XI K, BI JS, XU YN, LI YD, ZHANG ZG, LIU M

SCIENCE CHINAINFORMATION SCIENCES

XI K, BI JS, MAJUMDAR S, LI B, LIU J, XU YN, LIU M

MICROELECTRONICS RELIABILITY

XU YN, BI JS, LI YD, XI K, FAN LJ, LIU M, SANDIP M, LUO L

APPLIED PHYSICS EXPRESS

XU YN, BI JS, XI K, LIU M

APPLIED PHYSICS LETTERS

XI K, BI JS, HU Y, LI B, LIU J, XU YN, LIU M

ADVANCED MATERIALS

ZHAO XL, MA J, XIAO XH, LIU Q, SHAO L, CHEN D, LIU S, NIU JB, ZHANG XM, WANG Y, CAO RR, WANG W, DI ZF, LV HB, LONG SB, LIU M

JOURNAL OF MATERIALS CHEMISTRY B

ZHANG LM, WANG ZL, LU ZX, SHEN H, HUANG J, ZHAO QH, LIU M, HE NY, ZHANG ZJ

ACS APPLIED MATERIALS INTERFACES

SHEN H, LIU M, HE HX, ZHANG LM, HUANG J, CHONG Y, DAI JW, ZHANG ZJ

NUCLEAR SCIENCE TECHNIQUES

ZHANG HF, LIU M, YAN L, YU GJ, ZHOU XT

THERANOSTICS

SHEN H, ZHANG LM, LIU M, ZHANG ZJ