国家/地区
关键词 NEGATIVE BIAS TEMPERATURE INSTABILITY NBTI（2）
出版物
出版时间
机构
作者 LIU WJ（2）

Observation of the Ambient Effect in BTI Characteristics of Back-Gated Single Layer Graphene Field Effect Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

LIU WJ, SUN XW, TRAN XA, FANG Z, WANG ZR, WANG F, WU L, ZHANG JF, WEI J, ZHU HL, YU HY

Vth Shift in Single-Layer Graphene Field-Effect Transistors and Its Correlation With Raman Inspection

IEEE TRANSACTIONS ON DEVICE MATERIALS RELIABILITY

LIU WJ, SUN XW, TRAN XA, FANG Z, WANG ZR, WANG F, WU L, ZHANG JF, WEI J, ZHU HL, YU HY