国家/地区
关键词 HELIUM ION MICROSCOPE（3）
出版物
出版时间
机构
作者 MIZUTA H（3）

Conductance Tunable Suspended Graphene Nanomesh by Helium Ion Beam Milling

MICROMACHINES

LIU FY, WANG ZW, NAKANAO S, OGAWA S, MORITA Y, SCHMIDT M, HAQUE M, MURUGANATHAN M, MIZUTA H

Sub-10 nm patterning by focused He-ion beam milling for fabrication of downscaled graphene nano devices

MICROELECTRONIC ENGINEERING

KALHOR N, BODEN SA, MIZUTA H

Precise milling of nano-gap chains in graphene with a focused helium ion beam

NANOTECHNOLOGY

ZHOU YB, MAGUIRE P, JADWISZCZAK J, MURUGANATHAN M, MIZUTA H, ZHANG HZ