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PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, WEI W, PALLECCHI E, HAPPY H, JIMENEZ D

IEEE TRANSACTIONS ON MICROWAVE THEORY TECHNIQUES

DENG M, FADIL D, WEI W, PALLECCHI E, HAPPY H, DAMBRINE G, DE MATOS M, ZIMMER T, FREGONESE S

IEEE TRANSACTIONS ON ELECTRON DEVICES

MAVREDAKIS N, WEI W, PALLECCHI E, VIGNAUD D, HAPPY H, CORTADELLA RG, SCHAEFER N, CALIA AB, GARRIDO JA, JIMENEZ D

APPLIED SCIENCESBASEL

FADIL D, PASSI V, WEI W, BEN SALK S, ZHOU D, STRUPINSKI W, LEMME MC, ZIMMER T, PALLECCHI E, HAPPY H, FREGONESE S

APPLIED SCIENCESBASEL

WILMART Q, BOUKHICHA M, GRAEF H, MELE D, PALOMO J, ROSTICHER M, TANIGUCHI T, WATANABE K, BOUCHIAT V, BAUDIN E, BERROIR JM, BOCQUILLON E, FEVE G, PALLECCHI E, PLACAIS B

ACS APPLIED ELECTRONIC MATERIALS

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NANOSCALE

XU T, ALVAREZ AD, WEI W, ESCHIMESE D, BRILLARD C, ELIET S, LANCRY O, GALOPIN E, VAURETTE F, BERTHE M, DESREMES D, WEI B, XU J, LAMPIN JF, PALLECCHI E, HAPPY H, VIGNAUD D, GRANDIDIER B

NANOSCALE

XU T, ALVAREZ AD, WEI W, ESCHIMESE D, ELIET S, LANCRY O, GALOPIN E, VAURETTE F, BERTHE M, DESREMES D, WEI B, XU J, LAMPIN JF, PALLECCHI E, HAPPY H, VIGNAUD D, GRANDIDIER B

ELECTRONIC MATERIALS LETTERS

MELE D, MEHDHBI S, FADIL D, WEI W, OUERGHI A, LEPILLIET S, HAPPY H, PALLECCHI E

PHYSICAL REVIEW B

MAERO S, TORCHE A, PHUPHACHONG T, PALLECCHI E, OUERGHI A, FERREIRA R, DE VAULCHIER LA, GULDNER Y