国家/地区 China（2）
关键词 HISTOGRAM METHOD（2）
出版物
出版时间
机构
作者 REN LL（2）

Histogram method for reliable thickness measurements of graphene films using atomic force microscopy (AFM)

JOURNAL OF MATERIALS SCIENCE TECHNOLOGY

YAO YX, REN LL, GAO ST, LI S

Thickness measurements of graphene oxide flakes using atomic force microscopy: results of an international interlaboratory comparison

NANOTECHNOLOGY

BU TJ, GAO HF, YAO YX, WANG JF, POLLARD AJ, LEGGE EJ, CLIFFORD CA, DELVALLEE A, DUCOURTIEUX S, LAWN MA, BABIC B, COLEMAN VA, JAMTING A, ZOU S, CHEN MH, JAKUBEK ZJ, IACOB E, CHANTHAWONG N, MONGKOLSUTTIRAT K, ZENG GH, ALMEIDA CM, HE BC, HYDE L, REN LL