国家/地区 Usa（3）
关键词
出版物
出版时间 2011（3）
机构 IBM CORP（2）
作者 TROMP RM（3）

Direct Measurement of the Growth Mode of Graphene on SiC(0001) and SiC(000(1)over-bar)

PHYSICAL REVIEW LETTERS

HANNON JB, COPEL M, TROMP RM

A simple in situ method to detect graphene formation at SiC surfaces

APPLIED PHYSICS LETTERS

OIDA S, HANNON JB, TROMP RM, MCFEELY FR, YURKAS J

Large-Area Graphene Single Crystals Grown by Low-Pressure Chemical Vapor Deposition of Methane on Copper

JOURNAL OF THE AMERICAN CHEMICAL SOCIETY

LI XS, MAGNUSON CW, VENUGOPAL A, TROMP RM, HANNON JB, VOGEL EM, COLOMBO L, RUOFF RS