IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG
ACS APPLIED ELECTRONIC MATERIALS
WU BY, YANG YF, RIGOSI AF, HU JN, LEE HY, CHENG GJ, PANCHAL V, KRUSKOPF M, JIN H, WATANABE K, TANIGUCHI T, NEWELL DB, ELMQUIST RE, LIANG CT
CARBON
CHUANG CAS, MINEHARU M, MATSUNAGA M, LIU CW, WU BY, KIM GH, WATANABE K, TANIGUCHI T, LIANG CT, AOKI N
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
RIGOSI AF, PANNA AR, PAYAGALA SU, KRUSKOPF M, KRAFT ME, JONES GR, WU BY, LEE HY, YANG YF, HU JN, JARRETT DG, NEWELL DB, ELMQUIST RE
CARBON
RIGOSI AF, KRUSKOPF M, HILL HM, JIN H, WU BY, JOHNSON PE, ZHANG SY, BERILLA M, WALKER ARH, HACKER CA, NEWELL DB, ELMQUIST RE
POLYMER COMPOSITES
WU BY, LIU YL, SHU Y, YE L, ZHAO XW
NANOMATERIALS
WU BY, HOU SH, XUE YY, CHEN Z
SCIENTIFIC REPORTS
HU JN, RIGOSI AF, KRUSKOPF M, YANG YF, WU BY, TIAN JF, PANNA AR, LEE HY, PAYAGALA SU, JONES GR, KRAFT ME, JARRETT DG, WATANABE K, TANIGUCHI T, ELMQUIST RE, NEWELL DB
MICROELECTRONIC ENGINEERING
RIGOSI AF, LIU CI, WU BY, LEE HY, KRUSKOPF M, YANG YF, HILL HM, HU JN, BITTLE EG, OBRZUT J, WALKER ARH, ELMQUIST RE, NEWELL DB
POLYMER INTERNATIONAL
WU BY, YE L, LIU YL, ZHAO XW