SURFACE COATINGS TECHNOLOGY

WU H, XI K, XIAO S, NGAI S, ZHOU CL, HE MH, SHI KJ, YU Y, YANG YH, CHEN GH, DING KJ

MICROELECTRONICS RELIABILITY

XI K, BI JS, XU YN, LI YD, ZHANG ZG, LIU M

ENERGY ENVIRONMENTAL SCIENCE

LIN Y, WOOD M, IMASATO K, KUO JJH, LAM D, MORTAZAVI AN, SLADE TJ, HODGE SA, XI K, KANATZIDIS MG, CLARKE DR, HERSAM MC, SNYDER GJ

ADVANCED MATERIALS

XIONG YF, LIAO QB, HUANG ZP, HUANG X, KE C, ZHU HT, DONG CY, WANG HS, XI K, ZHAN P, XU F, LU YQ

TALANTA

LIU YL, LIU YZ, MENG Z, QIN Y, JIANG DC, XI K, WANG P

SCIENCE CHINAINFORMATION SCIENCES

XI K, BI JS, MAJUMDAR S, LI B, LIU J, XU YN, LIU M

MICROELECTRONICS RELIABILITY

XU YN, BI JS, LI YD, XI K, FAN LJ, LIU M, SANDIP M, LUO L

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

LUO BC, YAO Y, TIAN EK, SONG HZ, WANG XH, LI GW, XI K, LI BW, SONG HF, LI LT

APPLIED PHYSICS EXPRESS

XU YN, BI JS, XI K, LIU M

APPLIED PHYSICS LETTERS

XI K, BI JS, HU Y, LI B, LIU J, XU YN, LIU M