SURFACE COATINGS TECHNOLOGY

WU H, XI K, XIAO S, NGAI S, ZHOU CL, HE MH, SHI KJ, YU Y, YANG YH, CHEN GH, DING KJ

MICROELECTRONICS RELIABILITY

XI K, BI JS, XU YN, LI YD, ZHANG ZG, LIU M

ADVANCED MATERIALS

XIONG YF, LIAO QB, HUANG ZP, HUANG X, KE C, ZHU HT, DONG CY, WANG HS, XI K, ZHAN P, XU F, LU YQ

TALANTA

LIU YL, LIU YZ, MENG Z, QIN Y, JIANG DC, XI K, WANG P

SCIENCE CHINAINFORMATION SCIENCES

XI K, BI JS, MAJUMDAR S, LI B, LIU J, XU YN, LIU M

MICROELECTRONICS RELIABILITY

XU YN, BI JS, LI YD, XI K, FAN LJ, LIU M, SANDIP M, LUO L

APPLIED PHYSICS EXPRESS

XU YN, BI JS, XI K, LIU M

APPLIED PHYSICS LETTERS

XI K, BI JS, HU Y, LI B, LIU J, XU YN, LIU M

APL MATERIALS

CHEN R, ZHAO T, TIAN T, CAO S, COXON PR, XI K, FAIRENJIMENEZ D, KUMAR RV, CHEETHAM AK

CHEMICAL COMMUNICATIONS

WANG WN, GU JJ, HUA WW, JIA XD, XI K