IEEE ELECTRON DEVICE LETTERS

MA R, CHEN Q, ZHANG W, LU F, WANG CK, WANG A, XIE YH, TANG H

IEEE TRANSACTIONS ON DEVICE MATERIALS RELIABILITY

LI C, CHEN Q, NG J, ZHANG FL, WANG H, DI MF, PAN ZJ, WU TR, ZHANG K, XIE XM, XIE YH, WANG AL