2D MATERIALS

BACKES C, ABDELKADER AM, ALONSO C, ANDRIEUXLEDIER A, ARENAL R, AZPEITIA J, BALAKRISHNAN N, BANSZERUS L, BARJON J, BARTALI R, BELLANI S, BERGER C, BERGER R, ORTEGA MMB, BERNARD C, BETON PH, BEYER A, BIANCO A, BOGGILD P, BONACCORSO F, BARIN GB, BOTAS C, BUENO RA, CARRIAZO D, CASTELLANOSGOMEZ A, CHRISTIAN M, CIESIELSKI A, CIUK T, COLE MT, COLEMAN J, COLETTI C, CREMA L, CUN HY, DASLER D, DE FAZIO D, DIEZ N, DRIESCHNER S, DUESBERG GS, FASEL R, FENG XL, FINA A, FORTI S, GALIOTIS C, GARBEROGLIO G, GARCIA JM, GARRIDO JA, GIBERTINI M, GOLZHAUSER A, GOMEZ J, GREBER T, HAUKE F, HEMMI A, HERNANDEZRODRIGUEZ I, HIRSCH A, HODGE SA, HUTTEL Y, JEPSEN PU, JIMENEZ I, KAISER U, KAPLAS T, KIM H, KIS A, PAPAGELIS K, KOSTARELOS K, KRAJEWSKA A, LEE K, LI CF, LIPSANEN H, LISCIO A, LOHE MR, LOISEAU A, LOMBARDI L, LOPEZ MF, MARTIN O, MARTIN C, MARTINEZ L, MARTINGAGO JA, MARTINEZ JI, MARZARI N, MAYORAL A, MCMANUS J, MELUCCI M, MENDEZ J, MERINO C, MERINO P, MEYER AP, MINIUSSI E, MISEIKIS V, MISHRA N, MORANDI V, MUNUERA C, MUNOZ R, NOLAN H, ORTOLANI L, OTT AK, PALACIO I, PALERMO V, PARTHENIOS J, PASTERNAK I, PATANE A, PRATO M, PREVOST H, PRUDKOVSKIY V, PUGNO N, ROJO T, ROSSI A, RUFFIEUX P, SAMORI P, SCHUE L, SETIJADI E, SEYLLER T, SPERANZA G, STAMPFER C, STENGER I, STRUPINSKI W, SVIRKO Y, TAIOLI S, TEO KBK, TESTI M, TOMARCHIO F, TORTELLO M, TREOSSI E, TURCHANIN A, VAZQUEZ E, VILLARO E, WHELAN PR, XIA ZY, YAKIMOVA R, YANG S, YAZDI GR, YIM C, YOON D, ZHANG XH, ZHUANG XD, COLOMBO L, FERRARI AC, GARCIAHERNANDEZ M

INTERNATIONAL JOURNAL OF PRECISION ENGINEERING MANUFACTURINGGREEN TECHNOLOGY

WONG D, YIM C, PARK SS

ADVANCED MATERIALS INTERFACES

HALLAM T, BERNER NC, YIM C, DUESBERG GS

APPLIED PHYSICS LETTERS

YIM C, MCEVOY N, DUESBERG GS

NANO LETTERS

KIM HY, LEE K, MCEVOY N, YIM C, DUESBERG GS

ACS APPLIED MATERIALS INTERFACES

YIM C, KOCKERBECK ZA, JO SB, PARK SS

SOLIDSTATE ELECTRONICS

RIAZIMEHR S, BABLICH A, SCHNEIDER D, KATARIA S, PASSI V, YIM C, DUESBERG GS, LEMME MC

NANOSCALE

BERNER NC, WINTERS S, BACKES C, YIM C, DUMBGEN KC, KAMINSKA I, MACKOWSKI S, CAFOLLA AA, HIRSCH A, DUESBERG GS

CRYSTALS

CHOI J, BAEK S, JEON S, YIM C