国家/地区 Usa（3）
关键词 DEFECT（3）
出版物 ACS APPLIED MATERIA.（2）
出版时间
机构 UNIV ILLINOI.（2）
作者 BERRY V（3）

Intergrain Diffusion of Carbon Radical for Wafer-Scale, Direct Growth of Graphene on Silicon-Based Dielectrics

ACS APPLIED MATERIALS INTERFACES

NGUYEN P, BEHURA SK, SEACRIST MR, BERRY V

Electrical Transport and NetWork Percolation in Graphene and Boron Nitride Mixed-Platelet Structures

ACS APPLIED MATERIALS INTERFACES

DEBBARMA R, BEHURA S, NGUYEN P, SREEPRASAD TS, BERRY V

Defect guided conduction in graphene-derivatives and MoS2: Two-dimensional nanomaterial models

APPLIED MATERIALS TODAY

DEBBARMA R, NGUYEN NHL, BERRY V