国家/地区 | Usa(5) Japan(2) |
关键词 | DIELECTRIC SCREENING(9) |
出版物 | NANO LETTERS(2) |
出版时间 | 2016(2) 2019(2) 2021(2) |
机构 | GEORGIA INST.(2) |
作者 | BRENNER K(2) |
SMALL
SCHMIDT ME, MURUGANATHAN M, KANZAKI T, IWASAKI T, HAMMAM AMM, SUZUKI S, OGAWA S, MIZUTA H
ACS APPLIED NANO MATERIALS
MITOMA N, YANO Y, ITO H, MIYAUCHI Y, ITAMI K
IEEE ELECTRON DEVICE LETTERS
BRENNER K, BECK TJ, MEINDL JD
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA
SIEGEL DA, PARK CH, HWANG C, DESLIPPE J, FEDOROV AV, LOUIE SG, LANZARA A
NANO LETTERS
XIA JL, CHEN F, WIKTOR P, FERRY DK, TAO NJ
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
NASHED R, PAN CY, BRENNER K, NAEEMI A
NANO LETTERS
RAJA A, MONTOYACASTILLO A, ZULTAK J, ZHANG XX, YE ZL, ROQUELET C, CHENET DA, VAN DER ZANDE AM, HUANG P, JOCKUSCH S, HONE J, REICHMAN DR, BRUS LE, HEINZ TF
CHINESE PHYSICS B
WU CC, SHANG NZ, ZHAO ZX, ZHANG ZH, LIANG J, LIU C, ZUO YG, DING MC, WANG JH, HONG H, XIONG J, LIU KH
NANOTECHNOLOGY
WANG BB, KIM S, ZHAI TT, SEOK J, YANG H, SALASMONTIEL R