IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG
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APPLIED PHYSICS LETTERS
KOPYLOV S, TZALENCHUK A, KUBATKIN S, FAL KO VI
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KLOS JW, SHYLAU AA, ZOZOULENKO IV, XU HY, HEINZEL T
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RANA F, GEORGE PA, STRAIT JH, DAWLATY J, SHIVARAMAN S, CHANDRASHEKHAR M, SPENCER MG
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XU W, PEETERS FM, LU TC