IEEE SENSORS JOURNAL

NAGAREDDY VK, CHAN HK, HERNANDEZ SC, WHEELER VD, NYAKITI LO, MYERSWARD RL, EDDY CR, GOSS JP, WRIGHT NG, WALTON SG, GASKILL DK, HORSFALL AB

NANO LETTERS

FRIEDMAN AL, TEDESCO JL, CAMPBELL PM, CULBERTSON JC, AIFER E, PERKINS FK, MYERSWARD RL, HITE JK, EDDY CR, JERNIGAN GG, GASKILL DK

ACS NANO

CALDWELL JD, ANDERSON TJ, CULBERTSON JC, JERNIGAN GG, HOBART KD, KUB FJ, TADJER MJ, TEDESCO JL, HITE JK, MASTRO MA, MYERSWARD RL, EDDY CR, CAMPBELL PM, GASKILL DK

SENSORS

TRAMMELL SA, HERNANDEZ SC, MYERSWARD RL, ZABETAKIS D, STENGER DA, GASKILL DK, WALTON SG

2D MATERIALS

PANCHAL V, GIUSCA CE, LARTSEV A, MARTIN NA, CASSIDY N, MYERSWARD RL, GASKILL DK, KAZAKOVA O

ADVANCED MATERIALS INTERFACES

GIUSCA CE, PANCHAL V, MUNZ M, WHEELER VD, NYAKITI LO, MYERSWARD RL, GASKILL DK, KAZAKOVA O

ACS NANO

MUNZ M, GIUSCA CE, MYERSWARD RL, GASKILL DK, KAZAKOVA O

ADVANCED MATERIALS INTERFACES

KOTSAKIDIS JC, CURRIE M, GRUBISICCABO A, TADICH A, MYERSWARD RL, DEJARLD M, DANIELS KM, LIU C, EDMONDS MT, DE PARGA ALV, FUHRER MS, GASKILL DK

SENSORS

NAH J, PERKINS FK, LOCK EH, NATH A, BOYD A, MYERSWARD RL, GASKILL DK, OSOFSKY M, RAO MV