国家/地区 | Usa(4) |
关键词 | EPITAXIAL GRAPHENE(4) |
出版物 | |
出版时间 | 2018(3) |
机构 | NIST(2) |
作者 | KRUSKOPF M(4) |
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB
METROLOGIA
KRUSKOPF M, ELMQUIST RE
THIN SOLID FILMS
KRUSKOPF M, PIERZ K, PAKDEHI DM, WUNDRACK S, STOSCH R, BAKIN A, SCHUMACHER HW
MICROELECTRONIC ENGINEERING
RIGOSI AF, LIU CI, WU BY, LEE HY, KRUSKOPF M, YANG YF, HILL HM, HU JN, BITTLE EG, OBRZUT J, WALKER ARH, ELMQUIST RE, NEWELL DB