国家/地区 Sweden（2）
关键词 MOBILITY DEGRADATION（4）
出版物 IEEE TRANSACTIONS O.（3）
出版时间
机构
作者 JEPPSON K（2）

Total Ionizing Dose Induced Charge Carrier Scattering in Graphene Devices

IEEE TRANSACTIONS ON NUCLEAR SCIENCE

CRESS CD, CHAMPLAIN JG, ESQUEDA IS, ROBINSON JT, FRIEDMAN AL, MCMORROW JJ

A Parameter Extraction Methodology for Graphene Field-Effect Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

JEPPSON K

Mobility Degradation and Series Resistance in Graphene Field-Effect Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

JEPPSON K, ASAD M, STAKE J

An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, JIMENEZ D