国家/地区 Usa(9) China(5) Korea(2)
关键词 RELIABILITY(27)
出版物 IEEE ELECTRON DEVIC.(5) IEEE TRANSACTIONS O.(3) IEEE TRANSACTIONS O.(2)
IET CIRCUITS DEVICE.(2)
出版时间 2015(5) 2021(5) 2011(3) 2012(2) 2017(2) 2018(2) 2020(2)
机构 SUNY ALBANY(2) STANFORD UNI.(2)
作者 WONG HSP(3) BRIGGS B(2) CHEN XY(2) LEE EK(2)
LI L(2) NAGABHIRAVA .(2) YU B(2) YU TH(2)

IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING

DING D, LU YC, ZHAO RY, LIU X, DEEKNAMKUL C, REN C, MEHRSA A, KOMIYAMA T, KUZUM D

ACS APPLIED MATERIALS INTERFACES

SEO MH, KO JH, LEE JO, KO SD, MUN JH, CHO BJ, KIM YH, YOON JB

MICROELECTRONIC ENGINEERING

SATO M, OGAWA S, INUKAI M, IKENAGA E, MURO T, TAKAKUWA Y, NIHEI M, YOKOYAMA N

IEEE ELECTRON DEVICE LETTERS

CHEN XY, SEO DH, SEO S, CHUNG H, WONG HSP

IEEE ELECTRON DEVICE LETTERS

LIU WJ, SUN XW, FANG Z, WANG ZR, TRAN XA, WANG F, WU L, NG GI, ZHANG JF, WEI J, ZHU HL, YU HY

IEEE TRANSACTIONS ON NANOTECHNOLOGY

YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B

IEEE TRANSACTIONS ON NANOTECHNOLOGY

CHOUDHURY MR, YOON Y, GUO J, MOHANRAM K