国家/地区
关键词 RELIABILITY（5）
出版物 IEEE TRANSACTIONS O.（2） IET CIRCUITS DEVICE.（2）
出版时间 2015（5）
机构
作者

Hot-Carrier Degradation and Bias-Temperature Instability in Single-Layer Graphene Field-Effect Transistors: Similarities and Differences

IEEE TRANSACTIONS ON ELECTRON DEVICES

ILLARIONOV Y, SMITH A, VAZIRI S, OSTLING M, MUELLER T, LEMME M, GRASSER T

Vertical and Lateral Copper Transport through Graphene Layers

ACS NANO

LI L, CHEN XY, WANG CH, CAO J, LEE S, TANG A, AHN C, ROY SS, ARNOLD MS, WONG HSP

Versatile Compact Model for Graphene FET Targeting Reliability-Aware Circuit Design

IEEE TRANSACTIONS ON ELECTRON DEVICES

MUKHERJEE C, AGUIRREMORALES JD, FREGONESE S, ZIMMER T, MANEUX C

Thermal properties of graphene and few-layer graphene: applications in electronics

IET CIRCUITS DEVICES SYSTEMS

YAN Z, NIKA DL, BALANDIN AA

Graphene oxide-based non-volatile organic field effect memory transistors

IET CIRCUITS DEVICES SYSTEMS

ALAABDLQADER HS, SLEIMAN A, SAYERS P, MABROOK MF