国家/地区 Usa(5) Japan(2)
关键词 SCANNING TUNNELLING MICROSCOPY(10)
出版物 PHYSICAL REVIEW B(5) APPLIED PHYSICS LET.(2) JOURNAL OF APPLIED .(2)
出版时间 2009(10)
机构 SANDIA NATL .(2)
作者 BARTELT NC(2) MCCARTY KF(2) NIE S(2)

APPLIED PHYSICS LETTERS

DESHPANDE A, BAO W, ZHAO Z, LAU CN, LEROY BJ

JOURNAL OF APPLIED PHYSICS

NAKAJIMA T, SHINTANI K

PHYSICAL REVIEW B

STARODUB E, MAIER S, STASS I, BARTELT NC, FEIBELMAN PJ, SALMERON M, MCCARTY KF

PHYSICAL REVIEW B

HIBINO H, MIZUNO S, KAGESHIMA H, NAGASE M, YAMAGUCHI H

PHYSICAL REVIEW B

LOGINOVA E, NIE S, THURMER K, BARTELT NC, MCCARTY KF

JOURNAL OF VACUUM SCIENCE TECHNOLOGY A

NIE S, FEENSTRA RM

PHYSICAL REVIEW B

PERES NMR, TSAI SW, SANTOS JE, RIBEIRO RM

APPLIED PHYSICS LETTERS

SUTTER E, ACHARYA DP, SADOWSKI JT, SUTTER P

JOURNAL OF APPLIED PHYSICS

BORYSIUK J, BOZEK R, STRUPINSKI W, WYSMOLEK A, GRODECKI K, STEPNIEWSKI R, BARANOWSKI JM