APPLIED SURFACE SCIENCE
LI LY, LI WL, JIU JT, SUGANUMA K
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
LI SX, NAKADE K, HIRANO T, KAWAI K, ARIMA K
ACS APPLIED MATERIALS INTERFACES
TABATA H, SATO Y, OI K, KUBO O, KATAYAMA M
ACS NANO
TAHARA K, ISHIKAWA T, HIRSCH BE, KUBO Y, BROWN A, EYLEY S, DAUKIYA L, THIELEMANS W, LI Z, WALKE P, HIROSE S, HASHIMOTO S, DE FEYTER S, TOBE Y
PHYSICAL REVIEW X
KOSHINO M, YUAN NFQ, KORETSUNE T, OCHI M, KUROKI K, FU L
PHYSICAL REVIEW B
OCHI M, KOSHINO M, KUROKI K
JAPANESE JOURNAL OF APPLIED PHYSICS
KAWATA T, ONO T, KANAI Y, OHNO Y, MAEHASHI K, INOUE K, MATSUMOTO K
Investigation of surface potentials in reduced graphene oxide flake by Kelvin probe force microscopy
JAPANESE JOURNAL OF APPLIED PHYSICS
NEGISHI R, TAKASHIMA K, KOBAYASHI Y
CHEMCATCHEM
KOFUJI Y, ISOBE Y, SHIRAISHI Y, SAKAMOTO H, ICHIKAWA S, TANAKA S, HIRAI T
CARBON
HIRANO T, NAKADE K, LI SX, KAWAI K, ARIMA K