NANOIMPACT

GOODWIN DG, LAI T, LYU YD, LU CY, CAMPOS A, REIPA V, NGUYEN T, SUNG LP

JOURNAL OF PHYSICS DAPPLIED PHYSICS

LIU CI, SCALETTA DS, PATEL DK, KRUSKOPF M, LEVY A, HILL HM, RIGOSI AF

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG

PHYSICA BCONDENSED MATTER

RIGOSI AF, MARZANO M, LEVY A, HILL HM, PATEL DK, KRUSKOPF M, JIN H, ELMQUIST RE, NEWELL DB

AIP ADVANCES

LIU CI, PATEL DK, MARZANO M, KRUSKOPF M, HILL HM, RIGOSI AF

NANO LETTERS

STRELCOV E, ARBLE C, GUO HX, HOSKINS BD, YULAEV A, VLASSIOUK IV, ZHITENEV NB, TSELEV A, KOLMAKOV A

AIP ADVANCES

PATEL D, MARZANO M, LIU CI, HILL HM, KRUSKOPF M, JIN H, HU JN, NEWELL DB, LIANG CT, ELMQUIST R, RIGOSI AF

PHYSICAL REVIEW B

WALKUP D, GHAHARI F, GUTIERREZ C, WATANABE K, TANIGUCHI T, ZHITENEV NB, STROSCIO JA

JOURNAL OF COATINGS TECHNOLOGY RESEARCH

BERNARD C, GOODWIN DG, GU X, CELINA M, NYDEN M, JACOBS D, SUNG L, NGUYEN T

ACS APPLIED ELECTRONIC MATERIALS

WU BY, YANG YF, RIGOSI AF, HU JN, LEE HY, CHENG GJ, PANCHAL V, KRUSKOPF M, JIN H, WATANABE K, TANIGUCHI T, NEWELL DB, ELMQUIST RE, LIANG CT