SURFACE TOPOGRAPHYMETROLOGY PROPERTIES
WU YH, YU JJ, ZHAO WJ, WU WT, DONG JD, ZHOU KH, XUE QJ
NANOTECHNOLOGY
SHI LJ, LIU YQ, YANG F, GAO L, SUN J
MATERIALS
LIU XF, SUN GS, LIU B, YAN GG, GUAN M, ZHANG Y, ZHANG F, CHEN Y, DONG L, ZHENG L, LIU SB, TIAN LX, WANG L, ZHAO WS, ZENG YP
CHINESE PHYSICS B
DENG RX, ZHANG HR, ZHANG YH, CHEN ZY, SUI YP, GE XM, LIANG YJ, HU SK, YU GH, JIANG D
CHEMICAL PHYSICS LETTERS
ZOU F, ZHOU HT, YU N, YAO ZH, LIU F, SHEN CM
SCIENCE BULLETIN
YANG Y, FU Q, WEI W, BAO XH
JOURNAL OF ELECTRONIC MATERIALS
TANG CM, CHEN ZY, ZHANG HR, ZHANG YQ, ZHANG YH, SUI YP, YU GH, CAO YJ
JOURNAL OF ELECTRONIC MATERIALS
ZHANG YQ, ZHANG HR, ZHANG YH, CHEN ZY, TANG CM, SUI YP, WANG B, LI XL, XIE XM, YU GH, JIN Z, LIU XY
JOURNAL OF ELECTRONIC MATERIALS
ZHANG HR, ZHANG YH, WANG B, CHEN ZY, SUI YP, ZHANG YQ, TANG CM, ZHU B, XIE XM, YU GH, JIN Z, LIU XY