MICROSYSTEMS NANOENGINEERING
FAN XG, SMITH AD, FORSBERG F, WAGNER S, SCHRODER S, AKBARI SSA, FISCHER AC, VILLANUEVA LG, OSTLING M, LEMME MC, NIKLAUS F
NANO LETTERS
FAN XG, FORSBERG F, SMITH AD, SCHRODER S, WAGNER S, OSTLING M, LEMME MC, NIKLAUS F
NATURE ELECTRONICS
FAN XG, FORSBERG F, SMITH AD, SCHRODER S, WAGNER S, RODJEGARD H, FISCHER AC, OSTLING M, LEMME MC, NIKLAUS F
ACS APPLIED MATERIALS INTERFACES
QUELLMALZ A, SMITH AD, ELGAMMAL K, FAN XG, DELIN A, OSTLING M, LEMME M, GYLFASON KB, NIKLAUS F
CARBON
FAN XG, ELGAMMAL K, SMITH AD, OSTLING M, DELIN A, LEMME MC, NIKLAUS F
SOLIDSTATE ELECTRONICS
SMITH AD, VAZIRI S, NIKLAUS F, FISCHER AC, STERNER M, DELIN A, OSTLING M, LEMME MC
NANO LETTERS
SMITH AD, NIKLAUS F, PAUSSA A, VAZIRI S, FISCHER AC, STERNER M, FORSBERG F, DELIN A, ESSENI D, PALESTRI P, OSTLING M, LEMME MC
NANO LETTERS
VAZIRI S, LUPINA G, HENKEL C, SMITH AD, OSTLING M, DABROWSKI J, LIPPERT G, MEHR W, LEMME MC
Wafer-Scale Statistical Analysis of Graphene FETs-Part I: Wafer-Scale Fabrication and Yield Analysis
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M
IEEE TRANSACTIONS ON ELECTRON DEVICES
SMITH AD, WAGNER S, KATARIA S, MALM BG, LEMME MC, OSTLING M