国家/地区 | Usa(4) |
关键词 | GRAPHENE(2) |
出版物 | APPLIED PHYSICS LET.(2) |
出版时间 | 2010(2) |
机构 | UNIV CALIF LOS ANGELES(4) |
作者 | WOO JCS(4) |
MICROELECTRONICS RELIABILITY
WANG YJ, HUANG BC, ZHANG M, WOO JCS
IEEE TRANSACTIONS ON ELECTRON DEVICES
WANG YJ, MIAO CQ, HUANG BC, ZHU J, LIU W, PARK Y, XIE YH, WOO JCS
APPLIED PHYSICS LETTERS
ZHU J, JHAVERI R, WOO JCS
APPLIED PHYSICS LETTERS
ZHANG M, HUANG BC, WANG Y, WOO JCS