国家/地区 Sweden（2）
关键词 DEGRADATION（3）
出版物 IEEE TRANSACTIONS ON ELECTRON DEVICES（3）
出版时间
机构
作者 JEPPSON K（2）

A Parameter Extraction Methodology for Graphene Field-Effect Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

JEPPSON K

Mobility Degradation and Series Resistance in Graphene Field-Effect Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

JEPPSON K, ASAD M, STAKE J

An Extraction Method for Mobility Degradation and Contact Resistance of Graphene Transistors

IEEE TRANSACTIONS ON ELECTRON DEVICES

PACHECOSANCHEZ A, MAVREDAKIS N, FEIJOO PC, JIMENEZ D