IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
WANG Q, JING JY, WANG BT
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
RIGOSI AF, PANNA AR, PAYAGALA SU, KRUSKOPF M, KRAFT ME, JONES GR, WU BY, LEE HY, YANG YF, HU JN, JARRETT DG, NEWELL DB, ELMQUIST RE
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
DE MELO AA, DA SILVA TB, SANTIAGO MFD, MOREIRA CD, CRUZ RMS
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
SHIMAMOTO S, NAITOU Y, FUKUYAMA Y, KIRYU S, KANEKO N
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
NOVIKOV S, SATRAPINSKI A, LEBEDEVA N, IISAKKA I
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
REAL MA, LASS EA, LIU FH, SHEN T, JONES GR, SOONS JA, NEWELL DB, DAVYDOV AV, ELMQUIST RE
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LUOND F, KALMBACH CC, OVERNEY F, SCHURR J, JEANNERET B, MULLER A, KRUSKOPF M, PIERZ K, AHLERS F
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
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