国家/地区 Netherlands（2）
关键词
出版物 JOURNAL OF APPLIED PHYSICS（3）
出版时间
机构 FOM DUTCH IN.（2）
作者 LEE CJ（3）

Extraction of intrinsic field-effect mobility of graphene considering effects of gate-bias-induced contact modulation

JOURNAL OF APPLIED PHYSICS

LEE CJ, PARK H, KANG J, LEE J, CHOI M, PARK H

Graphene defect formation by extreme ultraviolet generated photoelectrons

JOURNAL OF APPLIED PHYSICS

GAO A, LEE CJ, BIJKERK F

Extreme ultraviolet induced defects on few-layer graphene

JOURNAL OF APPLIED PHYSICS

GAO A, RIZO PJ, ZOETHOUT E, SCACCABAROZZI L, LEE CJ, BANINE V, BIJKERK F