国家/地区 中国（2） 美国（2） 世界知识产权组织（2）
IPC部 H（2）
IPC大类 H01（2）
IPC小类 H01L（2）
IPC
发明人 YAGER T A（2）
公开年
申请年 2012（2）
专利权人 EMPIRE TECHN.（2） ISLAND GIANT.（2）

Method for detecting defects in sample using saturable absorber e.g. graphene, involves comparing reflected intensity ratio to incident intensity ratio to identify defects at locations.

YAGER T A

Partially altering defect area in a layer on substrate involves reacting substrate under reaction conditions to produce cationic area in exposed areas; adhering graphene oxide to cationic area to produce graphene oxide layer; and reducing.

MILLER S, YAGER T, MILLER S A, YAGER T A