国家/地区 美国（7）
IPC部 B（7）
IPC大类 C01（7）
IPC小类 C01B（7）
IPC C01B031/04（6） C08K003/04（5） C01B032/182（3）
C01B032/194（3） C09C001/46（3） C09C003/08（3）
C09C003/10（3） C09D005/24（3） C09D007/12（3）
C09D011/037（3） C09D011/52（3） C01B000/00（2）
C01B031/02（2） C01B032/184（2） C01B032/20（2）
发明人
公开年 2016（4） 2015（2）
申请年 2015（7）
专利权人

Graphene-containing coating film used for head lamp, comprises hydrates, graphene positioned on surface of hydrates, and silica particles including agglomerates of silica nanoparticles, positioned on surface of hydrate and graphene.

LEE K G, CHANG K I, HUR S H, LI K, ZHANG G, HSU S

Method for preparing graphene conductive film for flexible touch device, involves growing graphene layer on metal-catalyzed base, and coating polyamic acid solution layer on graphene layer, where polyimide film is formed by thermal curing.

DI Y

Graphene dispersant used in e.g. preparation of graphene composite powder, and graphene composite film, comprises polyaniline oligomer or derivative which is electroactive polymer, and combines with graphene via pi-pi bond.

DAI L, GU L, YU H, ZHENG Y, MA J, ZHAO H, LIU S, DING J

Manufacture of polyaniline-reduced graphene oxide composite used as e.g. ink for electromagnetic application, involves mixing graphene oxide dispersion containing emulsifying agent and oligomer solution and oxidizing.

BOCCHINI S, CHIOLERIO A, PORRO S

Forming a polymer composite comprising polymers and graphene quantum dots, useful in LEDs, comprises mixing a polymer component comprising polymers and/or polymer precursors with graphene quantum dots.

TOUR J M, KOVALCHUK A, XIANG C, TOUR J, CHANGSHENG X, TOUR YA M, XIANG CH

Manufacture of metal-containing graphene hybrid composite for forming electrode, involves mixing acid solution, metal salt containing metal ions and oxidized graphene, reducing resultant mixture and supporting reduced product.

LEE H, YOON Y

Graphite-based carbon material used as graphene precursor for preparing graphene dispersion, comprises rhombohedral graphite layer and hexagonal graphite layer, and has specified rate calculated based on X-ray diffraction method.

HASEGAWA S, KAMIYA N, HASEGAWA SHOJI, KAMIYA NAGISA, SHOJI H, NAGISA K, SHEN Y