IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB

JOURNAL OF MATERIALS CHEMISTRY C

DE MORAES ACM, OBRZUT J, SANGWAN VK, DOWNING JR, CHANEY LE, PATEL DK, ELMQUIST RE, HERSAM MC

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG

PHYSICA BCONDENSED MATTER

RIGOSI AF, MARZANO M, LEVY A, HILL HM, PATEL DK, KRUSKOPF M, JIN H, ELMQUIST RE, NEWELL DB

METROLOGIA

MARZANO M, KRUSKOPF M, PANNA AR, RIGOSI AF, PATEL DK, JIN HY, CULAR S, CALLEGARO L, ELMQUIST RE, ORTOLANO M

ACS APPLIED ELECTRONIC MATERIALS

WU BY, YANG YF, RIGOSI AF, HU JN, LEE HY, CHENG GJ, PANCHAL V, KRUSKOPF M, JIN H, WATANABE K, TANIGUCHI T, NEWELL DB, ELMQUIST RE, LIANG CT

MATERIALS

CHUANG CS, LIU CW, YANG YF, SYONG WR, LIANG CT, ELMQUIST RE

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

RIGOSI AF, PANNA AR, PAYAGALA SU, KRUSKOPF M, KRAFT ME, JONES GR, WU BY, LEE HY, YANG YF, HU JN, JARRETT DG, NEWELL DB, ELMQUIST RE

CARBON

RIGOSI AF, KRUSKOPF M, HILL HM, JIN H, WU BY, JOHNSON PE, ZHANG SY, BERILLA M, WALKER ARH, HACKER CA, NEWELL DB, ELMQUIST RE

SCIENTIFIC REPORTS

HU JN, RIGOSI AF, KRUSKOPF M, YANG YF, WU BY, TIAN JF, PANNA AR, LEE HY, PAYAGALA SU, JONES GR, KRAFT ME, JARRETT DG, WATANABE K, TANIGUCHI T, ELMQUIST RE, NEWELL DB