国家/地区 Poland(47) Belgium(5) Denmark(3) Republic(2)
关键词 GRAPHENE(18) RAMAN SPECTROSCOPY(4) 2D MATERIAL(3)
METROLOGY(3) SECONDARY ION MASS .(3) SURFACE RECONSTRUCT.(3)
TERAHERTZ SPECTROSC.(3) CHEMICAL VAPOR DEPO.(2) CVD(2)
CVD GRAPHENE(2) CYTOSKELETON(2) CYTOTOXICITY(2)
FIBER LASER(2) FOCAL CONTACT(2) GERMANIUM(2)
出版物 OPTICS EXPRESS(7) 2D MATERIALS(5) APPLIED PHYSICS LET.(4)
APPLIED SURFACE SCI.(4) NANOTECHNOLOGY(3) SCIENTIFIC REPORTS(3)
ACS APPLIED MATERIA.(2) ACTA PHYSICA POLONI.(2) CARBON(2)
JOURNAL OF APPLIED .(2) MATERIALS(2) SURFACE ENGINEERING(2)
出版时间 2015(9) 2016(9) 2013(8) 2018(8) 2017(6) 2019(6) 2020(6) 2014(4) 2021(3) 2022(3) 2012(2)
机构 WROCLAW UNIV.(12) INST ELECT M.(11) UNIV LODZ(5) VRIJE UNIV B.(5)
SILESIAN TEC.(4) UNIV WARSAW(4) TECH UNIV DE.(3) WARSAW UNIV .(3)
WARSAW UNIV .(3)
作者 PASTERNAK I(65)

ACS APPLIED MATERIALS INTERFACES

SITEK J, PLOCHARSKI J, PASTERNAK I, GERTYCH AP, MCALEESE C, CONRAN B, ZDROJEK M, STRUPINSKI W

MATERIALS

DUB M, SAI P, PRZEWLOKA A, KRAJEWSKA A, SAKOWICZ M, PRYSTAWKO P, KACPERSKI J, PASTERNAK I, CYWINSKI G, BUT D, KNAP W, RUMYANTSEV S

NANOTECHNOLOGY

MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH

SCIENTIFIC REPORTS

ADAMOWICZ J, PASTERNAK I, KLOSKOWSKI T, GNIADEK M, VAN BREDA SV, BUHL M, BALCERCZYK D, GAGAT M, GRZANKA D, STRUPINSKI W, POKRYWCZYNSKA M, DREWA T

2D MATERIALS

BACKES C, ABDELKADER AM, ALONSO C, ANDRIEUXLEDIER A, ARENAL R, AZPEITIA J, BALAKRISHNAN N, BANSZERUS L, BARJON J, BARTALI R, BELLANI S, BERGER C, BERGER R, ORTEGA MMB, BERNARD C, BETON PH, BEYER A, BIANCO A, BOGGILD P, BONACCORSO F, BARIN GB, BOTAS C, BUENO RA, CARRIAZO D, CASTELLANOSGOMEZ A, CHRISTIAN M, CIESIELSKI A, CIUK T, COLE MT, COLEMAN J, COLETTI C, CREMA L, CUN HY, DASLER D, DE FAZIO D, DIEZ N, DRIESCHNER S, DUESBERG GS, FASEL R, FENG XL, FINA A, FORTI S, GALIOTIS C, GARBEROGLIO G, GARCIA JM, GARRIDO JA, GIBERTINI M, GOLZHAUSER A, GOMEZ J, GREBER T, HAUKE F, HEMMI A, HERNANDEZRODRIGUEZ I, HIRSCH A, HODGE SA, HUTTEL Y, JEPSEN PU, JIMENEZ I, KAISER U, KAPLAS T, KIM H, KIS A, PAPAGELIS K, KOSTARELOS K, KRAJEWSKA A, LEE K, LI CF, LIPSANEN H, LISCIO A, LOHE MR, LOISEAU A, LOMBARDI L, LOPEZ MF, MARTIN O, MARTIN C, MARTINEZ L, MARTINGAGO JA, MARTINEZ JI, MARZARI N, MAYORAL A, MCMANUS J, MELUCCI M, MENDEZ J, MERINO C, MERINO P, MEYER AP, MINIUSSI E, MISEIKIS V, MISHRA N, MORANDI V, MUNUERA C, MUNOZ R, NOLAN H, ORTOLANI L, OTT AK, PALACIO I, PALERMO V, PARTHENIOS J, PASTERNAK I, PATANE A, PRATO M, PREVOST H, PRUDKOVSKIY V, PUGNO N, ROJO T, ROSSI A, RUFFIEUX P, SAMORI P, SCHUE L, SETIJADI E, SEYLLER T, SPERANZA G, STAMPFER C, STENGER I, STRUPINSKI W, SVIRKO Y, TAIOLI S, TEO KBK, TESTI M, TOMARCHIO F, TORTELLO M, TREOSSI E, TURCHANIN A, VAZQUEZ E, VILLARO E, WHELAN PR, XIA ZY, YAKIMOVA R, YANG S, YAZDI GR, YIM C, YOON D, ZHANG XH, ZHUANG XD, COLOMBO L, FERRARI AC, GARCIAHERNANDEZ M

APPLIED SURFACE SCIENCE

SITEK J, PASTERNAK I, GRZONKA J, SOBIESKI J, JUDEK J, DABROWSKI P, ZDROJEK M, STRUPINSKI W

CARBON

DABROWSKI P, ROGALA M, PASTERNAK I, KRUKOWSKI P, BARANOWSKI JM, STRUPINSKI W, LUTSYK I, KOWALCZYK DA, PAWLOWSKI S, KLUSEK Z

ACS APPLIED NANO MATERIALS

TORTELLO M, PASTERNAK I, ZERANSKACHUDEK K, STRUPINSKI W, GONNELLI RS, FINA A

MICROELECTRONIC ENGINEERING

WHELAN PR, ZHAO XJ, PASTERNAK I, STRUPINSKI W, JEPSEN PU, BOGGILD P

APPLIED SURFACE SCIENCE

JUDEK J, PASTERNAK I, DABROWSKI P, STRUPINSKI W, ZDROJEK M