国家/地区 Poland(88) Sweden(6) Belgium(5) England(5)
Denmark(3) France(3) Spain(3) Turkey(2)
Usa(2)
关键词 GRAPHENE(28) SIC(9) RAMAN SPECTROSCOPY(8)
CVD(5) EPITAXIAL GRAPHENE(5) 2D MATERIAL(4)
CVD GRAPHENE(3) METROLOGY(3) SECONDARY ION MASS .(3)
SURFACE RECONSTRUCT.(3) TERAHERTZ SPECTROSC.(3) CHEMICAL VAPOR DEPO.(2)
CONDUCTIVITY(2) CYTOTOXICITY(2) FIBER LASER(2)
出版物 APPLIED PHYSICS LET.(14) ACTA PHYSICA POLONI.(11) JOURNAL OF APPLIED .(8)
2D MATERIALS(7) OPTICS EXPRESS(7) PHYSICAL REVIEW B(7)
CARBON(6) APPLIED SURFACE SCI.(5) SCIENTIFIC REPORTS(5)
NANOTECHNOLOGY(4) OPTICS LETTERS(3) ACS APPLIED MATERIA.(2)
AIP ADVANCES(2) JOURNAL OF PHYSICAL.(2) MICRON(2)
出版时间 2015(18) 2016(15) 2017(15) 2013(14) 2018(11) 2011(8) 2019(8) 2014(7) 2012(6) 2020(6) 2010(5) 2021(4) 2009(3) 2022(2)
机构 INST ELECT M.(21) UNIV WARSAW(20) WROCLAW UNIV.(13) UNIV LODZ(7)
WARSAW UNIV .(6) VRIJE UNIV B.(5) CHALMERS UNI.(4) NATL PHYS LA.(3)
POZNAN UNIV .(3) TECH UNIV DE.(3) BILKENT UNIV(2) CSIC(2)
IND RES INST.(2) POLISH ACAD .(2) SILESIAN TEC.(2) UNIV FLORIDA(2)
WARSAW UNIV .(2)
作者 STRUPINSKI W(122)

ACS APPLIED MATERIALS INTERFACES

SITEK J, PLOCHARSKI J, PASTERNAK I, GERTYCH AP, MCALEESE C, CONRAN B, ZDROJEK M, STRUPINSKI W

NANOTECHNOLOGY

MACKENZIE DMA, KALHAUGE KG, WHELAN PR, OSTERGAARD FW, PASTERNAK I, STRUPINSKI W, BOGGILD P, JEPSEN PU, PETERSEN DH

SCIENTIFIC REPORTS

ADAMOWICZ J, PASTERNAK I, KLOSKOWSKI T, GNIADEK M, VAN BREDA SV, BUHL M, BALCERCZYK D, GAGAT M, GRZANKA D, STRUPINSKI W, POKRYWCZYNSKA M, DREWA T

2D MATERIALS

BACKES C, ABDELKADER AM, ALONSO C, ANDRIEUXLEDIER A, ARENAL R, AZPEITIA J, BALAKRISHNAN N, BANSZERUS L, BARJON J, BARTALI R, BELLANI S, BERGER C, BERGER R, ORTEGA MMB, BERNARD C, BETON PH, BEYER A, BIANCO A, BOGGILD P, BONACCORSO F, BARIN GB, BOTAS C, BUENO RA, CARRIAZO D, CASTELLANOSGOMEZ A, CHRISTIAN M, CIESIELSKI A, CIUK T, COLE MT, COLEMAN J, COLETTI C, CREMA L, CUN HY, DASLER D, DE FAZIO D, DIEZ N, DRIESCHNER S, DUESBERG GS, FASEL R, FENG XL, FINA A, FORTI S, GALIOTIS C, GARBEROGLIO G, GARCIA JM, GARRIDO JA, GIBERTINI M, GOLZHAUSER A, GOMEZ J, GREBER T, HAUKE F, HEMMI A, HERNANDEZRODRIGUEZ I, HIRSCH A, HODGE SA, HUTTEL Y, JEPSEN PU, JIMENEZ I, KAISER U, KAPLAS T, KIM H, KIS A, PAPAGELIS K, KOSTARELOS K, KRAJEWSKA A, LEE K, LI CF, LIPSANEN H, LISCIO A, LOHE MR, LOISEAU A, LOMBARDI L, LOPEZ MF, MARTIN O, MARTIN C, MARTINEZ L, MARTINGAGO JA, MARTINEZ JI, MARZARI N, MAYORAL A, MCMANUS J, MELUCCI M, MENDEZ J, MERINO C, MERINO P, MEYER AP, MINIUSSI E, MISEIKIS V, MISHRA N, MORANDI V, MUNUERA C, MUNOZ R, NOLAN H, ORTOLANI L, OTT AK, PALACIO I, PALERMO V, PARTHENIOS J, PASTERNAK I, PATANE A, PRATO M, PREVOST H, PRUDKOVSKIY V, PUGNO N, ROJO T, ROSSI A, RUFFIEUX P, SAMORI P, SCHUE L, SETIJADI E, SEYLLER T, SPERANZA G, STAMPFER C, STENGER I, STRUPINSKI W, SVIRKO Y, TAIOLI S, TEO KBK, TESTI M, TOMARCHIO F, TORTELLO M, TREOSSI E, TURCHANIN A, VAZQUEZ E, VILLARO E, WHELAN PR, XIA ZY, YAKIMOVA R, YANG S, YAZDI GR, YIM C, YOON D, ZHANG XH, ZHUANG XD, COLOMBO L, FERRARI AC, GARCIAHERNANDEZ M

APPLIED SCIENCESBASEL

FADIL D, PASSI V, WEI W, BEN SALK S, ZHOU D, STRUPINSKI W, LEMME MC, ZIMMER T, PALLECCHI E, HAPPY H, FREGONESE S

APPLIED SURFACE SCIENCE

SITEK J, PASTERNAK I, GRZONKA J, SOBIESKI J, JUDEK J, DABROWSKI P, ZDROJEK M, STRUPINSKI W

CARBON

DABROWSKI P, ROGALA M, PASTERNAK I, KRUKOWSKI P, BARANOWSKI JM, STRUPINSKI W, LUTSYK I, KOWALCZYK DA, PAWLOWSKI S, KLUSEK Z

ACS APPLIED NANO MATERIALS

TORTELLO M, PASTERNAK I, ZERANSKACHUDEK K, STRUPINSKI W, GONNELLI RS, FINA A

MICROELECTRONIC ENGINEERING

WHELAN PR, ZHAO XJ, PASTERNAK I, STRUPINSKI W, JEPSEN PU, BOGGILD P

APPLIED SURFACE SCIENCE

JUDEK J, PASTERNAK I, DABROWSKI P, STRUPINSKI W, ZDROJEK M