IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB
PHYSICA ELOWDIMENSIONAL SYSTEMS NANOSTRUCTURES
LI HM, HAN X, CHILDRESS AS, RAO AM, KOLEY G
ACS APPLIED MATERIALS INTERFACES
O SUILLEABHAIN D, VEGAMAYORAL V, KELLY AG, HARVEY A, COLEMAN JN
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
YU YJ
NANOSCALE RESEARCH LETTERS
KANG ES, ISMAIL R
NANO LETTERS
LIU JK, LI QQ, ZOU Y, QIAN QK, JIN YH, LI GH, JIANG KL, FAN SS
JOURNAL OF COMPUTATIONAL ELECTRONICS
LIU MH
APPLIED PHYSICS LETTERS
DUAN X, STEPHANOVICH VA, SEMENOV YG, KIM KW
APPLIED PHYSICS LETTERS
WU XS, HU Y, RUAN M, MADIOMANANA NK, BERGER C, DE HEER WA
APPLIED PHYSICS LETTERS
LIMMER T, HOUTEPEN AJ, NIGGEBAUM A, TAUTZ R, DA COMO E