国家/地区 | Usa(4) Germany(3) |
关键词 | EPITAXIAL GRAPHENE(8) |
出版物 | |
出版时间 | 2018(3) 2021(2) |
机构 | NIST(2) PHYS TECH BU.(2) |
作者 | KRUSKOPF M(8) |
IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT
PAYAGALA SU, RIGOSI AF, PANNA AR, POLLAROLO A, KRUSKOPF M, SCHLAMMINGER S, JARRETT DG, BROWN R, ELMQUIST RE, BROWN D, NEWELL DB
METROLOGIA
KRUSKOPF M, ELMQUIST RE
THIN SOLID FILMS
KRUSKOPF M, PIERZ K, PAKDEHI DM, WUNDRACK S, STOSCH R, BAKIN A, SCHUMACHER HW
MICROELECTRONIC ENGINEERING
RIGOSI AF, LIU CI, WU BY, LEE HY, KRUSKOPF M, YANG YF, HILL HM, HU JN, BITTLE EG, OBRZUT J, WALKER ARH, ELMQUIST RE, NEWELL DB
JOURNAL OF PHYSICSCONDENSED MATTER
KRUSKOPF M, PIERZ K, WUNDRACK S, STOSCH R, DZIOMBA T, KALMBACH CC, MULLER A, BARINGHAUS J, TEGENKAMP C, AHLERS FJ, SCHUMACHER HW
IEEE TRANSACTIONS ON ELECTRON DEVICES
KRUSKOPF M, BAUER S, PIMSUT Y, CHATTERJEE A, PATEL DK, RIGOSI AF, ELMQUIST RE, PIERZ K, PESEL E, GOTZ M, SCHURR J
CARBON
RATHORE S, PATEL DK, THAKUR MK, HAIDER G, KALBAC M, KRUSKOPF M, LIU CE, RIGOSI AF, ELMQUIST RE, LIANG CT, HONG PD
ACS APPLIED ELECTRONIC MATERIALS
CHATTERJEE A, KRUSKOPF M, WUNDRACK S, HINZE P, PIERZ K, STOSCH R, SCHERER H