国家/地区 Japan（2）
关键词 HELIUM ION MICROSCOPE（5）
出版物 ACS NANO（2）
出版时间
机构
作者 MIZUTA H（3） MURUGANATHAN.（2） OGAWA S（2）

Conductance Tunable Suspended Graphene Nanomesh by Helium Ion Beam Milling

MICROMACHINES

LIU FY, WANG ZW, NAKANAO S, OGAWA S, MORITA Y, SCHMIDT M, HAQUE M, MURUGANATHAN M, MIZUTA H

Sub-10 nm patterning by focused He-ion beam milling for fabrication of downscaled graphene nano devices

MICROELECTRONIC ENGINEERING

KALHOR N, BODEN SA, MIZUTA H

Conduction Tuning of Graphene Based on Defect-Induced Localization

ACS NANO

NAKAHARAI S, IIJIMA T, OGAWA S, SUZUKI S, LI SL, TSUKAGOSHI K, SATO S, YOKOYAMA N

Etching of Graphene Devices with a Helium Ion Beam

ACS NANO

LEMME MC, BELL DC, WILLIAMS JR, STERN LA, BAUGHER BWH, JARILLOHERRERO P, MARCUS CM

Precise milling of nano-gap chains in graphene with a focused helium ion beam

NANOTECHNOLOGY

ZHOU YB, MAGUIRE P, JADWISZCZAK J, MURUGANATHAN M, MIZUTA H, ZHANG HZ