国家/地区 Usa（9）
关键词 RELIABILITY（9）
出版物 IEEE ELECTRON DEVIC.（3） IEEE TRANSACTIONS O.（2）
出版时间 2011（3）
机构 SUNY ALBANY（2） STANFORD UNI.（2）
作者 BRIGGS B（2） LEE EK（2） NAGABHIRAVA .（2） WONG HSP（2）
YU B（2） YU TH（2）

Evaluation of Durability of Transparent Graphene Electrodes Fabricated on Different Flexible Substrates for Chronic In Vivo Experiments

IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING

DING D, LU YC, ZHAO RY, LIU X, DEEKNAMKUL C, REN C, MEHRSA A, KOMIYAMA T, KUZUM D

In-Situ Grown Graphene Enabled Copper Interconnects With Improved Electromigration Reliability

IEEE ELECTRON DEVICE LETTERS

LI L, ZHU ZW, YOON A, WONG HSP

Graphene Interconnect Lifetime: A Reliability Analysis

IEEE ELECTRON DEVICE LETTERS

CHEN XY, SEO DH, SEO S, CHUNG H, WONG HSP

Bilayer Graphene/Copper Hybrid On-Chip Interconnect: A Reliability Study

IEEE TRANSACTIONS ON NANOTECHNOLOGY

YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B

Graphene Nanoribbon FETs: Technology Exploration for Performance and Reliability

IEEE TRANSACTIONS ON NANOTECHNOLOGY

CHOUDHURY MR, YOON Y, GUO J, MOHANRAM K

Large-Scale Graphene Transistors with Enhanced Performance and Reliability Based on Interface Engineering by Phenylsilane Self-Assembled Monolayers

NANO LETTERS

LIU ZH, BOL AA, HAENSCH W

Bilayer Graphene System: Current-Induced Reliability Limit

IEEE ELECTRON DEVICE LETTERS

YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B

Thermal properties of graphene and few-layer graphene: applications in electronics

IET CIRCUITS DEVICES SYSTEMS

YAN Z, NIKA DL, BALANDIN AA

Demonstration of CMOS-Compatible Multi-Level Graphene Interconnects With Metal Vias

IEEE TRANSACTIONS ON ELECTRON DEVICES

AGASHIWALA K, JIANG JK, PARTO K, ZHANG DJ, YEH CH, BANERJEE K