APPLIED SURFACE SCIENCE
BODNAR W, SCHIORLIN M, FRANK A, SCHULZ T, WOHRL N, MIRON C, SCHEU C, KOLB JF, KRUTH A
ACS NANO
VATS N, WANG Y, SEN S, SZILAGYI S, OCHNER H, ABB S, BURGHARD M, SIGLE W, KERN K, VAN AKEN PA, RAUSCHENBACH S
ACS APPLIED MATERIALS INTERFACES
HEILMANN M, PRIKHODKO AS, HANKE M, SABELFELD A, BORGARDT NI, LOPES JMJ
ULTRAMICROSCOPY
BOOTHROYD CB, MORENO MS, DUCHAMP M, KOVACS A, MONGE N, MORALES GM, BARBERO CA, DUNINBORKOWSKI RE
ACS NANO
WALDMANN D, BUTZ B, BAUER S, ENGLERT JM, JOBST J, ULLMANN K, FROMM F, AMMON M, ENZELBERGEE M, HIRSCH A, MAIER S, SCHMUKI P, SEYLLER T, SPIECKER E, WEBERT HB
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BORRNERT F, AVDOSHENKO SM, BACHMATIUK A, IBRAHIM I, BUCHNER B, CUNIBERTI G, RUMMELI MH
SOLID STATE COMMUNICATIONS
PANTELIC RS, MEYER JC, KAISER U, STAHLBERG H
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HUANG PY, KURASCH S, SRIVASTAVA A, SKAKALOVA V, KOTAKOSKI J, KRASHENINNIKOV AV, HOVDEN R, MAO QY, MEYER JC, SMET J, MULLER DA, KAISER U
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WESTENFELDER B, MEYER JC, BISKUPEK J, KURASCH S, SCHOLZ F, KRILL CE, KAISER U
CHEMCATCHEM
SCHNEIDER JJ