IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

OE T, RIGOSI AF, KRUSKOPF M, WU BY, LEE HY, YANG YF, ELMQUIST RE, KANEKO NH, JARRETT DG

IEEE TRANSACTIONS ON INSTRUMENTATION MEASUREMENT

RIGOSI AF, PANNA AR, PAYAGALA SU, KRUSKOPF M, KRAFT ME, JONES GR, WU BY, LEE HY, YANG YF, HU JN, JARRETT DG, NEWELL DB, ELMQUIST RE

SCIENTIFIC REPORTS

HU JN, RIGOSI AF, KRUSKOPF M, YANG YF, WU BY, TIAN JF, PANNA AR, LEE HY, PAYAGALA SU, JONES GR, KRAFT ME, JARRETT DG, WATANABE K, TANIGUCHI T, ELMQUIST RE, NEWELL DB

PHYSICAL REVIEW B

HU JN, RIGOSI AF, LEE JU, LEE HY, YANG YF, LIU CI, ELMQUIST RE, NEWELL DB

MICROELECTRONIC ENGINEERING

RIGOSI AF, LIU CI, WU BY, LEE HY, KRUSKOPF M, YANG YF, HILL HM, HU JN, BITTLE EG, OBRZUT J, WALKER ARH, ELMQUIST RE, NEWELL DB

2D MATERIALS

RIGOSI AF, HILL HM, GLAVIN NR, POOKPANRATANA SJ, YANG YF, BOOSALIS AG, HU JN, RICE A, ALLERMAN AA, NGUYEN NV, HACKER CA, ELMQUIST RE, WALKER ARH, NEWELL DB

PHYSICAL REVIEW B

HILL HM, RIGOSI AF, CHOWDHURY S, YANG YF, NGUYEN NV, TAVAZZA F, ELMQUIST RE, NEWELL DB, WALKER ARH

NANOSCALE

CHUANG CS, YANG YF, POOKPANRATANA S, HACKER CA, LIANG CT, ELMQUIST RE

SMALL

RIGOSI AF, GLAVIN NR, LIU CI, YANG YF, OBRZUT J, HILL HM, HU JN, LEE HY, WALKER ARH, RICHTER CA, ELMQUIST RE, NEWELL DB

2D MATERIALS

LIU CW, CHUANG CS, YANG YF, ELMQUIST RE, HO YJ, LEE HY, LIANG CT