MEASUREMENT SCIENCE TECHNOLOGY
POLLARD AJ
ACS NANO
GIUSCA CE, RUNGGER I, PANCHAL V, MELIOS C, LIN Z, LIN YC, KAHN E, ELIAS AL, ROBINSON JA, TERRONES M, KAZAKOVA O
CARBON
MELIOS C, CENTENO A, ZURUTUZA A, PANCHAL V, GIUSCA CE, SPENCER S, SILVA SRP, KAZAKOVA O
SURFACE TOPOGRAPHYMETROLOGY PROPERTIES
WANG R, PEARCE R, GALLOP J, PATEL T, ZHAO F, POLLARD A, KLEIN N, JACKMAN R, ZURUTUZA A, HAO L
2D MATERIALS
MELIOS C, SPENCER S, SHARD A, STRUPINSKI W, SILVA SRP, KAZAKOVA O
Atmospheric doping effects in epitaxial graphene: correlation of local and global electrical studies
2D MATERIALS
PANCHAL V, GIUSCA CE, LARTSEV A, MARTIN NA, CASSIDY N, MYERSWARD RL, GASKILL DK, KAZAKOVA O
ACS APPLIED MATERIALS INTERFACES
SAINSBURY T, PASSARELLI M, NAFTALY M, GNANIAH S, SPENCER SJ, POLLARD AJ