国家/地区 Usa（4）
关键词 BILAYER GRAPHENE BL.（2） BREAKDOWN（2） RELIABILITY（2）
出版物 APPLIED PHYSICS LET.（2）
出版时间 2011（3）
机构 SUNY ALBANY（4）
作者 YU TH（4）

Bilayer Graphene/Copper Hybrid On-Chip Interconnect: A Reliability Study

IEEE TRANSACTIONS ON NANOTECHNOLOGY

YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B

Chemical vapor deposition-assembled graphene field-effect transistor on hexagonal boron nitride

APPLIED PHYSICS LETTERS

KIM E, YU TH, SONG ES, YU B

Local electrical stress-induced doping and formation of monolayer graphene P-N junction

APPLIED PHYSICS LETTERS

YU TH, LIANG CW, KIM CD, YU B

Bilayer Graphene System: Current-Induced Reliability Limit

IEEE ELECTRON DEVICE LETTERS

YU TH, LEE EK, BRIGGS B, NAGABHIRAVA B, YU B