国家/地区 韩国（4）
IPC部 G（2）
IPC大类 G01（2）
IPC小类
IPC
发明人 KIM J H（2） LEE H J（2）
公开年 2016（4）
申请年 2014（4）
专利权人 KOREA INST MACHINERY MATERIALS（4）

Method for testing dimension of graphene sheet of semiconductor flat panel display, involves measuring shading value from optical microscope image, and determining floor number of graphene included in graphene sheet.

LEE W O, LEE J U, OH Y S, LEE K E

Multi-layer graphene utilizing highly stretchable electrode, has multi layer graphene formed on substrate that is formed with transparent oxide conductive film, where substrate is fixed on lower layer graphene.

CHOI B I, KIM J H, LEE H J, LEE S B, LEE S R, WON S J

Graphene defect detection apparatus for use in display, has digital camera for capturing picture of visible light image of graphene, white light source for emitting white light, and determining unit for determining defect site of graphene.

KIM S, ISA A, KIM J H, KIM K, LEE S M, OH C S, LEE H J, KIM K S

Manufacture of graphene nanomesh involves forming graphene and photosensitive film on substrate, exposing photosensitive film using dot-lens mask, forming dot pattern on photosensitive film and etching dot pattern.

CHANG W S, JEONG S H, KIM D J