国家/地区 欧洲专利局（EPO）（7）
IPC部 C（7）
IPC大类 C01（7） C04（7） B82（5）
H01（5） C08（4） C10（3）
C23（3） B01（2） B29（2）
B33（2） C03（2） C09（2）
H05（2）
IPC小类 C01B（7）
IPC C01B031/04（7）
发明人 HASEGAWA S（2） HASEGAWA SHOJI（2） KAMIYA N（2）
KAMIYA NAGISA（2） LIU X（2） NAGISA K（2）
SHEN Y（2） SHOJI H（2） SONG Z（2）
公开年 2015（7）
申请年 2014（4）  2015（2） 
专利权人 CORNING INC（2） GRAPHENE PLA.（2） GRAPHENE PLA.（2）

Composition for producing graphite blocks used as thick lubrication blocks, electrode replacements for synthetic graphite electrodes, neutron ray filters, and as furnace liners, comprises graphite flakes and graphene oxide.

CHIU G, SUNG T, MCCLOSKEY J W, HYATT R J

Particle for particulate material used for composite material, particle dispersion and article comprises stacked sub-structures in which each sub-structure includes stack of graphene layers.

WALTERS I, WALTERS D

Formation of graphene scroll for synthesizing graphene article, involves annealing catalyst substrate in hydrogen gas, exposing substrate to reaction gas mixture, detaching substrate from graphene and consolidating synthesized graphene.

VLASSIOUK I V, IVANOV I N, DATSKOS P G

Graphite-based carbon material used as graphene precursor for preparing graphene dispersion, comprises rhombohedral graphite layer and hexagonal graphite layer, and has specified rate calculated based on X-ray diffraction method.

HASEGAWA S, KAMIYA N, HASEGAWA SHOJI, KAMIYA NAGISA, SHOJI H, NAGISA K, SHEN Y

Forming graphene, useful as e.g. electrical or thermal conductive substrate, comprises placing and heating a substrate within reaction chamber, introducing carbon precursor into chamber, and forming graphene layer on surface of substrate.

LIU X, MANLEY R G, MORENA R M, SONG Z

Substrate for graphene growth, has glass-ceramic body, and multiple metallic islands that is disposed on surface of glass-ceramic body.

BORRELLI N F, FEKETY C R, LIU X, SONG Z

Graphite-type carbon raw material used as graphene precursor, has rhombohedral system graphite layer and hexagonal system graphite layer in ratio more than preset value, as measured using peak intensities specific planes of layers.

HASEGAWA S, KAMIYA N, SHOJI H, NAGISA K, HASEGAWA SHOJI, KAMIYA NAGISA, SHEN Y