国家/地区 Belgium(8) Usa(3)
关键词 GRAPHENE(5) INTERCONNECT(4) MEAN FREE PATH(3)
CARRIER MOBILITY(2) CONTACT RESISTANCE(2) DELAY(2)
SHEET RESISTANCE(2) TWISTED GRAPHENE(2)
出版物 IEEE TRANSACTIONS O.(3) MICROELECTRONIC ENG.(3)
出版时间 2015(2) 2017(2) 2018(2) 2020(2) 2021(2)
机构 KATHOLIEKE U.(5) GEORGIA INST.(2)
作者 TOKEI Z(12)

JAPANESE JOURNAL OF APPLIED PHYSICS

KETSOMBUN E, WU XY, ASSELBERGHS I, ACHRA S, HUYGHEBAERT C, LIN D, TOKEI Z, UENO K

IEEE TRANSACTIONS ON ELECTRON DEVICES

NASHED R, PAN CY, WU XY, ASSELBERGHS I, TOKEI Z, CATTHOOR F, NAEEMI A

ADVANCED MATERIALS INTERFACES

WU XY, CHUANG YT, CONTINO A, SOREE B, BREMS S, TOKEI Z, HEYNS M, HUYGHEBAERT C, ASSELBERGHS I

IEEE ELECTRON DEVICE LETTERS

CONTINO A, CIOFI I, WU XY, ASSELBERGHS I, CELANO U, WILSON CJ, TOKEI Z, GROESENEKEN G, SOREE B

MICROELECTRONIC ENGINEERING

POLITOU M, WU XY, ASSELBERGHS I, CONTINO A, SOREE B, RADU I, HUYGHEBAERT C, TOKEI Z, DE GENDT S, HEYNS M

MICROELECTRONIC ENGINEERING

WU XY, ASSELBERGHS I, POLITOU M, CONTINO A, RADU I, HUYGHEBAERT C, TOKEI Z, SOREE B, DE GENDT S, DE FEYTER S, HEYNS M

MICROELECTRONIC ENGINEERING

POLITOU M, ASSELBERGHS I, SOREE B, LEE CS, SAYAN S, LIN D, PASHAEI P, HUYGHEBAERT C, RAGHAVAN P, RADU I, TOKEI Z, DE GENDT S, HEYNS M

APPLIED PHYSICS LETTERS

POLITOU M, ASSELBERGHS I, RADU I, CONARD T, RICHARD O, LEE CS, MARTENS K, SAYAN S, HUYGHEBAERT C, TOKEI Z, DE GENDT S, HEYNS M

IEEE TRANSACTIONS ON ELECTRON DEVICES

PAN CY, RAGHAVAN P, CEYHAN A, CATTHOOR F, TOKEI Z, NAEEMI A

CARBON

ACHRA S, WU XY, TREPALIN V, NUYTTEN T, LUDWIG J, AFANAS EV V, BREMS S, SOREE B, TOKEI Z, HEYNS M, ASSELBERGHS I