国家/地区 France（6）
关键词
出版物 SCIENTIFIC REPORTS（3） PHYSICAL REVIEW B（2）
出版时间 2010（2） 2013（2）
机构 CNRS（4） SYNCHROTRON .（2）
作者 WALLART X（7）

Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction

SCIENTIFIC REPORTS

RAZADOCOLAMBO I, AVILA J, VIGNAUD D, GODEY S, WALLART X, WOODRUFF DP, ASENSIO MC

Exploring electronic structure of one-atom thick polycrystalline graphene films: A nano angle resolved photoemission study

SCIENTIFIC REPORTS

AVILA J, RAZADO I, LORCY S, FLEURIER R, PICHONAT E, VIGNAUD D, WALLART X, ASENSIO MC

High-resolution angle-resolved photoemission spectroscopy study of monolayer and bilayer graphene on the C-face of SiC

PHYSICAL REVIEW B

MOREAU E, GODEY S, WALLART X, RAZADOCOLAMBO I, AVILA J, ASENSIO MC, VIGNAUD D

Graphene growth by molecular beam epitaxy on the carbon-face of SiC

APPLIED PHYSICS LETTERS

MOREAU E, GODEY S, FERRER FJ, VIGNAUD D, WALLART X, AVILA J, ASENSIO MC, BOURNEL F, GALLET JJ

Graphene growth by molecular beam epitaxy using a solid carbon source

PHYSICA STATUS SOLIDI AAPPLICATIONS MATERIALS SCIENCE

MOREAU E, FERRER FJ, VIGNAUD D, GODEY S, WALLART X

NanoARPES of twisted bilayer graphene on SiC: absence of velocity renormalization for small angles

SCIENTIFIC REPORTS

RAZADOCOLAMBO I, AVILA J, NYS JP, CHEN C, WALLART X, ASENSIO MC, VIGNAUD D

Probing the electronic properties of graphene on C-face SiC down to single domains by nanoresolved photoelectron spectroscopies

PHYSICAL REVIEW B

RAZADOCOLAMBO I, AVILA J, CHEN C, NYS JP, WALLART X, ASENSIO MC, VIGNAUD D